Refer to Section 3.3.5 for further information on dry circuit testing.
有关干电路测试的更详细的信息请参见第3.3.5节.
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At last we can see the simulation result, circuit testing, and conclusions.
论文最后给出了电路整体仿真结果, 芯片测试, 以及结论.
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Other measurement considerations, including dry circuit testing and testing inductive devices, are also described.
此外还要介绍其它一些测量中要考虑的因素, 包括干电路测试和电感性器件的测试等.
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Principle and method for the Opened Magnetic Circuit testing of Surface defects were proposed.
在分析现有表面缺陷检测方法特点的基础上,提出了开放磁路检测原理与方法.
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