H – top of lamp housing to inside of test box.

电灯外壳的顶部到测试箱的内部.

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This paper introduces a optimum seeking design method for high - low temperature test - box.

介绍了一种高低温试验箱的优化设计方法.

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E – light aperture center to inside of test box.

电灯开口中心到测试箱的内部.

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G – luminaire height ( bottom inside of test box to top of permanently attached parts ).

灯具高度 ( 测试箱内底部到永久附件之间的距离 ).

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