Qingdao, a letter carrier table tripod chip data sheet, hot carrier chip TCM 081.

青岛鼎信载波表芯片数据手册, 热点载波芯片TCM081.

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Hot - carrier effect is a major reliability failure mechanism of MOS devices and circuits.

热载流子效应是影响MOS器件与电路可靠性的主要因素.

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Qingdao, a letter carrier table tripod chips, data sheet, hot carrier chip TCC 081.

青岛鼎信载波表芯片, 数据手册, 热点载波芯片TCC081.

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